Scanning electron microscope (SEM) |
JSM-6510 |
/ |
High resolution transmission electron microscope (HRTEM) |
JEM-2100 |
/ |
X-ray diffraction (XRD) |
Rigaku D/max-2500 |
X-ray diffractometer at 35
kV, ranging from 10 to 80° |
X-ray photoelectron spectroscopy (XPS) |
ESCALAB 250 |
/ |
UV-visible diffuse reflectance spectra (DRS) |
UV-2550 |
wavelength
between 200 and 850nm |