Characterization instruments Version Test Conditions
Scanning electron microscope (SEM) JSM-6510 /
High resolution transmission electron microscope (HRTEM) JEM-2100 /
X-ray diffraction (XRD) Rigaku D/max-2500 X-ray diffractometer at 35 kV, ranging from 10 to 80°
X-ray photoelectron spectroscopy (XPS) ESCALAB 250 /
UV-visible diffuse reflectance spectra (DRS) UV-2550 wavelength between 200 and 850nm