Authors   

Xulei Wu^1,2, Bingjie Dang², Hong Wang⁵, Xiulong Wu^1,*, and Yuchao Yang^2,3,4,*

¹School of Electronics and Information Engineering, Anhui University, Hefei 230601, China.

²Key Laboratory of Microelectronic Devices and Circuits (MOE), School of Integrated Circuits, Peking University, Beijing 100871, China.