3. Results and Discussion
The X-ray diffraction patterns of the synthesized samples are presented
in Figure 1. Although the diffraction peaks of the composite materials
resemble those of UiO-66, two main diffraction peaks at 2θ less
than 10° show a marked disturbance in the crystal structure, indicating
some shortening of the lattice parameters. This might be related to the
pores of smaller sizes than those in the parent UiO-66 materials
[35].